Acta Chimica Sinica ›› 1960, Vol. 26 ›› Issue (2): 100-102. Previous Articles     Next Articles

光谱法测定高纯度二氧化硅中微量杂质

黄昆华   

  1. 杭州, 浙江化工研究所
  • 收稿日期:1959-05-20 出版日期:1960-06-15 发布日期:2013-06-03

THE SPECTROGRAPHIC ANALYSIS OF TRACE ELEMENTS IN SILICA OF HIGH PURITY

HUANG KUN-HUA   

  1. Institute of Chemical Industries, Hangchow
  • Received:1959-05-20 Online:1960-06-15 Published:2013-06-03

This paper reports the spectrographic analysis of five trace elements in silica, using a.c. arc and cap electrode. By plotting two selected lines instead of one against log, concentration of the elements in question, calibration curves obtained are steeper in slope. The results thus found are precise. With this technique trace elements of the order 10-4,-10-2 per cent can be det0rmined. Average deviations do not exceed eight per cant.