Several methods for measuring the dynamic double-layer capacitance, i.e. the double-layer capacitance in the presence of faradaic process have been reported, but most of them require a graphical anal. of individually obtained data points. Because the importance of the dynamic double-layer capacitance in electrode kinetics, a new method for measuring the dynamic double-layer capacitance automatically has been proposed on the basis of the fundamental equations of vf-E curve.

Key words: OSCILLOSCOPIC POLAROGRAPHY, CURVE, DIFFERENTIAL CAPACITY