Peak drifts of emission spectral lines recorded on a sequential ICP- AES spectrometer are the main factor that seriously decreases the precision and accuracy of sample determinations. The functional relationships between peak drift Δλ, and wavelength λ, temperautre T are found in this paper. The functional relationship curves Δλ-λ, and Δλ-T were determined and expressed in the form of polynomial equations. The present study indicates that the curves Δλ-λ for different monochromators are similar, but the curves Δλ-T for different monochromators are quite different. Based on the above- mentioned polynomial equations, an intelligent wavelength calibrating device (IWC) is developed for the sequential ICP spectrometer, which can replace a local thermostat of the sequential ICP-AES or the traditional line-profile method. The applications of the sequential ICP-IWC illustrate that the IWC device can significantly improve the precision of peak determination and have widespread prospects.

Key words: ICP-ATOMIC EMISSION SPECTROMETRY, OPTICAL SPECTROMETERS, WAVE LENGTH, CORRECTION, CALIBRATION EQUIPMENT