The photocorrosion behavior of n-CdTe electrodes was investigated by cyclic voltammetry measurement. By using PAR M368 electrochem. impedance system, the impedance diagrams of this electrode at different potentials were determine The surface state d. and other factors are estimated The experimental results show that n-CdTe/liq. junction has the characteristics of a Schottky junction and that the Fermi level of the electrode may be pinned.

Key words: SINGLE CRYSTALS, ALTERNATING CURRENT CIRCUITS, CADMIUM TELLURIDE, IMPEDANCE MEASUREMENTS, SEMICONDUCTOR ELECTRODE, PHOTOETCHING, CYCLOVOLTAMGRAPH, PHOTOELECTROD