Characterization of heterocyclic new compounds' structure using time-of-flight secondary ion mass spectrometry (TOF-SIMS) combined with chemical derivation
DENG CHAOHUI;ZONG XIANGFU;Ren Pingda;DONG TINGWEI. Characterization of heterocyclic new compounds' structure using time-of-flight secondary ion mass spectrometry (TOF-SIMS) combined with chemical derivation[J]. Acta Chimica Sinica, 1996, 54(8): 802-806.