Acta Chimica Sinica ›› 1996, Vol. 54 ›› Issue (9): 888-892. Previous Articles     Next Articles

Original Articles

金属(Ti, Ni)/(0001)Al~2O~3界面电子结构的光电子能谱研究

刘韩星;张汉林;任海兰;欧阳世翕;王典芬   

  1. 武汉工业大学新材料研究所;武汉工业大学测试中心
  • 发布日期:1996-09-15

Study on the electronic structure of (Ti, Ni)/(0001)Al~2O~3 interfaces by XPS

LIU HANXING;ZHANG HANLIN;REN HAILAN;OUYANG SHIXI;WANG DIANFEN   

  • Published:1996-09-15

The electronic structure of Ti, Ni/Al~2O~3 interfaces were studied by X-ray photoelectron spectra (XPS) in situ during sputtering. The experiment results show that in the interface area, for Ti/Al~2O~3, Ti was oxidated and Al^3^+ was reduced; for Ni/Al~2O~3, Ni has several oxidation states including the spinel.

Key words: NICKEL, ALUMINIUM OXIDE, TITANIUM, ELECTRONIC STRUCTURE, PHOTOELECTRON SPECTROSCOPY

CLC Number: