SIOC English
有机化学
高级检索

有机化学 ›› 1993, Vol. 13 ›› Issue (1): 41-43. 上一篇    下一篇

研究论文

纯C60/C70的热解吸电子电离质谱研究

李晓东;陈培责;胡耀铭;林子森   

  1. 复旦大学分析测试中心
  • 发布日期:1993-02-25

Thermal desorption electron ionization mass-spectrometric investigations of purified C60/C70

LI XIAODONG;CHEN PEIZE;HU YAOMING;LIN ZISEN   

  • Published:1993-02-25

被引次数

1

用热解析电子电离方法来测C60/C70的质谱获得了较好的结果。纯C60/C70样品是按文献[5]方法制得的。将C60/C70样品直接送入离子源内, 瞬间快速升温, 使C60/C70样品在分解之前就得到充分挥发, 再用70eV的电子轰击C60, C70蒸气, 使之电离得到分析鉴定。实验结果表明, 热解析电子电离方法有快原子轰击(FAB)等方法比拟的优点, 它不仅简单快速, 而且谱图本底峰少, 分子结构信息多。

关键词: 质谱法, 碳离子, 热解吸, 化学电离源质谱法, 碎片, 快原子轰击

Thermal desorption electron electron ionization mass spectra of puuified C60/C70 have been studied in a quadrupole mass spectrometry.The ionization method os very convenient and efficient in contrast to the Fast atom bombrdment. besides the observations of C60+, C70+ ions, many new fragment ions such as C58^2+, C56^2+ are also observed from TDEI mass spectrum .the ionization energies of C60. C70and their frament behaviors been discussed simply.

Key words: THERMAL DESORPTION, MASS SPECTROGRAPHY, CARBON ION, CHEMICAL IONIZATION SOURCE MASS SPECTROMETRY, FRAGMENTS, FAST ATOM BOMBARDMENT

中图分类号: