化学学报 ›› 1988, Vol. 46 ›› Issue (5): 445-451. 上一篇    下一篇

研究论文

XPS法对聚乙炔化学掺杂机制的研究

曹镛;郭可珍   

  1. 中国科学院化学研究所
  • 发布日期:1988-05-15

On the doping mechanism of polyacetylene: XPS studies

CAO YONG;GUO KEZHEN   

  • Published:1988-05-15

用XPS(X射线光电子能谱法)研究了十余种掺杂聚乙炔的电荷转移过程, 发现对大部分掺杂剂, 由Cls谱裂分所计算的电荷转移量与掺杂剂的氧化电位直接相关. 一些强氧化性或过渡金属质子酸也符合这一规律, 同时观察到掺杂后这些氧化性质子酸本身发生价态变化. 因此这些质子酸的掺杂不是文南中所报道的质子酸机制而是氧化还原机制.所研究的若干种非氧化性或弱氧化性质子酸掺杂后电导率均较低, 这进一步表明掺杂过程中的电荷转移过程是产生高导聚乙炔的必要条件.

关键词: 氧化, 聚乙烯, 掺杂, X射线光电子谱法, 电位, 电荷转移, 国家自然科学基金

XPS studies of the doping mechanism of polyacetylene (I) revealed that the charge per carbon atom in the metallic region was closely related to the oxidation potential for both electron acceptors and oxidative protonic-type dopants. For doping with strong oxidative protonic acids such as HClO4 and H2SO4, the charge transfer from I chain to the dopant mol. and simultaneous reduction of dopant mol. to a lower valence state were observed by XPS. For nonoxidative or weak oxidative protonic acid dopants, the max. doping level and the elec. conductivity achieved were much lower than those in the case of charge-transfer process.

Key words: OXIDATION, POLYETHYLENE, DOPE, X-RAY PHOTOELECTRON SPECTROMETRY, ELECTRIC POTENTIAL, CHARGE TRANSFER, NSFC

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