SIOC English
化学学报
高级检索

化学学报 ›› 1990, Vol. 48 ›› Issue (1): 92-94. 上一篇    下一篇

研究论文

导电聚吡络对阴离子深度分布的XPS研究

郭可珍;李永舫;潘承璜;钱人元   

  1. 中国科学院化学研究所
  • 发布日期:1990-01-15

XPS study of depth distribution of anion in conducting polypyrrole

GUO KEZHEN;LI YONGFANG;PAN CHENGHUANG;QIAN RENYUAN   

  • Published:1990-01-15

PDF

510

被引次数

4

本文试图通过对X射线光电子能谱的电子起飞角依赖性的研究, 来得到导电聚吡咯的几十埃表面层内的阴离子浓度分布。

关键词: Ｘ射线光电子谱法, 阴离子, 溅射, 离子浓度, 酸根, 聚吡咯, 导电高聚物, 硝酸 P

The depth distribution of NO3- in the thin layer of 50 ?thick below the surface of polypyrrole was studied on the basis of the dependence of XPS with electron flying angles. The anion concentration on the surface was much lower than that in the body.

Key words: X-RAY PHOTOELECTRON SPECTROMETRY, ANION, SPUTTERING, ION CONCENTRATION, ACID RADICAL, POLYPYRROLE, CONDUCTING POLYMER, NITRIC ACID P

中图分类号: